Oxford Instruments Industrial Analysis is now part of Hitachi High-Technologies Group.

X-Strata920 – Cost-effective, non-destructive and reliable

A simple to use, quality control analyser for coating thickness and materials analysis.

  • New modern design
  • Rapid measurement (seconds) from one to four coating layers
  • Range of hardware configurations, i.e. Standard base, Minwell, or automated table to cover a wide range of sample types
  • “Slotted Chamber” to measure large area samples, e.g. printed circuit boards, flat sheets etc
  • Compliance with ISO3487 and ASTM B568 test methods

X-Strata980 – Flexible, multi-element, non-destructive materials analysis

A comprehensive, powerful XRF analyser measuring a wide range of samples - very small to large.

  • Fast, accurate analysis on solids, liquids and powders
  • Large sample chamber with programmable base for ease of loading and measurement (option)
  • Integrated PC for minimal bench space
  • High resolution detector for lowest detection limits
  • Wide range of applications including photovoltaic cells, RoHS and precious metals