ORCA Conductive AFM
ORCA™ provides conductive AFM imaging and I-V measurement capabilities. The standard module is capable of measuring currents from ~1 pA to 20 nA. Other current ranges and Dual Gain versions are available. Electrical Tools Application Note
High Voltage Piezoresponse Force Microscopy (PFM)
The HV-PFM option enables high sensitivity, high bias, and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics. The kit includes an integrated high voltage amplifier (±150 V), high voltage cantilever holder, high voltage sample mount, and conductive cantilevers. PFM Application Note
Electrochemical Strain Microscopy (ESM)
ESM is a novel scanning probe microscopy technique that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution. ESM Application Note
Scanning Tunnelling Microscopy (STM)
STM can be useful for high resolution imaging of conductive samples in solids with unprecedented resolution.
Nanoscale Time Dependent Dielectric Breakdown (NanoTDDB)
NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision. Constant or ramped biases up to +150 V can be applied while monitoring current through a conductive AFM probe. Electrical Tools Application Note
Scanning Microwave Impedance Microscopy (sMIM)
sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors and insulators. Not available on Cypher ES. sMIM Application Note
Other Cypher AFM Accessory Groups
Accessories include modes for characterizing elastic modulus, loss modulus, loss tangent, and thermal properties
Accessories include sample heaters and coolers, glovebox, and more
Accessories include cantilevers holders for operation in liquid droplets or with perfusion and blueDrive photothermal...