Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.
We provide general purpose EDS, WDS and EBSD tools that are used to characterise materials at the micro- and nanoscale
We provide application-specific solutions such as Gunshot Residue Analysis, Mineral Liberation, ThinFilm analysis and more.
Through our Omniprobe products, we have the ability to physically manipulate samples inside the microscope to prepare TEM or atom probe samples, study nanowires, and build nanoassemblies.
With our integrated solutions we can layer films at the atomic level and measure their thickness, perform fault isolation, failure analysis and the measurement of mechanical and electrical properties – all at the nanoscale.
Our innovative technology delivers faster, more accurate analysis for both research and industrial applications